DocumentCode
2273266
Title
A detailed examination of the correlation between imports and failure-proneness of software components
Author
Duala-Ekoko, Ekwa ; Robillard, Martin P.
Author_Institution
Sch. of Comput. Sci., McGill Univ., Montreal, QC, Canada
fYear
2009
fDate
15-16 Oct. 2009
Firstpage
34
Lastpage
43
Abstract
Research has provided evidence that type usage in source files is correlated with the risk of failure of software components. Previous studies that investigated the correlation between type usage and component failure assigned equal blame to all the types imported by a component with a failure history, regardless of whether a type is used in the component, or associated to its failures. A failure-prone component may use a type, but it is not always the case that the use of this type has been responsible for any of its failures. To gain more insight about the correlation between type usage and component failure, we introduce the concept of a failure-associated type to represent the imported types referenced within methods fixed due to failures. We conducted two studies to investigate the tradeoffs between the equal-blame approach and the failure-associated type approach. Our results indicate that few of the types or packages imported by a failure-prone component are associated with its failures - less than 25% of the type imports, and less than 55% of the packages whose usage were reported to be highly correlated with failures by the equal-blame approach, were actually correlated with failures when we looked at the failure-associated types.
Keywords
software fault tolerance; equal-blame approach; failure history; failure-associated type approach; failure-prone component; failure-proneness; software components; Computer science; History; Java; Packaging; Resource management; Software development management; Software engineering; Software measurement; Software packages; Software systems;
fLanguage
English
Publisher
ieee
Conference_Titel
Empirical Software Engineering and Measurement, 2009. ESEM 2009. 3rd International Symposium on
Conference_Location
Lake Buena Vista, FL
ISSN
1938-6451
Print_ISBN
978-1-4244-4842-5
Electronic_ISBN
1938-6451
Type
conf
DOI
10.1109/ESEM.2009.5316047
Filename
5316047
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