• DocumentCode
    2274440
  • Title

    Composite Dielectrics and Surfactants for Low Voltage Electrowetting Devices

  • Author

    Raj, B. ; Smith, N.R. ; Christy, L. ; Dhindsa, M. ; Heikenfeld, J.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Cincinnati Univ., Cincinnati, OH
  • fYear
    2008
  • fDate
    13-16 July 2008
  • Firstpage
    187
  • Lastpage
    190
  • Abstract
    In this work electrowetting operation at <12 V has been achieved through implementation of composite dielectrics and surfactants. The composite dielectrics consist of A12O3 and Si3N4 covered by a thin film of hydrophobic Cytop fluoropolymer. These composite dielectrics exhibit higher capacitance and therefore lower voltage electrowetting operation. Atomic layer deposition of A12O3 and plasma-enhanced chemical vapor deposition of Si3N4 were chosen because they can be deposited at low temperature, are pin-hole free, and because they can be conformably coated on 3D surfaces. Surfactants were also explored to lower the water/oil interfacial surface tension and thereby further reduce the voltages required for electrowetting. These results are important for continued development of arrayed electrowetting optics for displays and beam steering applications.
  • Keywords
    beam steering; composite materials; dielectric devices; dielectric thin films; plasma CVD; polymer films; surface tension; surfactants; thin film devices; wetting; arrayed electrowetting optics; atomic layer deposition; beam steering applications; composite dielectrics; hydrophobic Cytop fluoropolymer; low voltage electrowetting devices; plasma-enhanced chemical vapor deposition; surfactants; thin films; water-oil interfacial surface tension; Atomic layer deposition; Capacitance; Chemical vapor deposition; Dielectric devices; Dielectric thin films; Low voltage; Optical arrays; Plasma chemistry; Plasma temperature; Semiconductor thin films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    University/Government/Industry Micro/Nano Symposium, 2008. UGIM 2008. 17th Biennial
  • Conference_Location
    Louisville, KY
  • Print_ISBN
    978-1-4244-2484-9
  • Electronic_ISBN
    978-1-4244-2485-6
  • Type

    conf

  • DOI
    10.1109/UGIM.2008.55
  • Filename
    4573233