DocumentCode :
2274684
Title :
Stress testing for improved power electronics reliability
Author :
Quayle, Bruce R.
Author_Institution :
Div. of Oxy Metal Ind., R&D Electr. Controls, Udylite Co., Warren, MI, USA
fYear :
1974
fDate :
10-12 June 1974
Firstpage :
116
Lastpage :
117
Abstract :
In the electrochemical power industry, substantial improvements in control reliability may be realized by extensive inplant tests of the controls under stress (notably temperature). This paper describes a series of test conditions to which first components and then finished controls are subjected. One example of resulting reliability is given.
Keywords :
circuit testing; power electronics; reliability; control reliability; electrochemical power industry; power electronics reliability; stress testing; test conditions; Coatings; Integrated circuits; Materials; Reliability; Stress; Temperature control; Testing;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Power Electronics Specialists Conference, 1974 IEEE
Conference_Location :
Murray Hill, NJ
ISSN :
0275-9306
Type :
conf
DOI :
10.1109/PESC.1974.7074334
Filename :
7074334
Link To Document :
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