DocumentCode
2276558
Title
Synthesis and Characterization of PZT Ferroelectric Nanocrystals Current Measurement
Author
Kubo, K. ; Echizen, M. ; Nishida, T. ; Takeda, T. ; Uchiyama, K. ; Shiosaki, T.
Author_Institution
Nara Inst. of Sci. & Technol. (NAIST), Nara
fYear
2007
fDate
27-31 May 2007
Firstpage
291
Lastpage
292
Abstract
Ferroelectric lead zirconium titanate (PZT) has been used in FeRAMs, which are expected to become common large capacity devices. We have extensively studied PZT thin films and their micro-processing. However, there are several problems of degradation by crystal defects at grain boundaries in thin films and surface damage by microfabrication. Self-assembled nanocrystals are useful for solving these problems. However, position control in nanocrystal growth is very difficult. Thus, atomically flat substrates and RF magnetron sputtering together are used for better position control. RF magnetron sputtering stimulates nucleation of crystals because the sputtered particles impinge on substrates with high energy. We grew PZT nanocrystals on alpha-Al2O3 (001) single crystalline substrate surfaces. Atomic force microscopy observations indicated that triangular-shaped crystals were formed on the substrates.
Keywords
aluminium compounds; atomic force microscopy; ferroelectric thin films; grain boundaries; lead compounds; nanostructured materials; nanotechnology; nucleation; self-assembly; sputter deposition; Al2O3; FeRAMs; PZT ferroelectric nanocrystals; PZT thin films; PbZrO3TiO3; RF magnetron sputtering; alpha-Al2O3 (001); atomic force microscopy; capacity devices; crystal defects; crystal nucleation; grain boundaries; micro-processing; microfabrication; nanocrystal growth; self-assembled nanocrystals; surface damage; Atomic force microscopy; Crystallization; Current measurement; Ferroelectric materials; Grain boundaries; Nanocrystals; Position control; Radio frequency; Sputtering; Zirconium;
fLanguage
English
Publisher
ieee
Conference_Titel
Applications of Ferroelectrics, 2007. ISAF 2007. Sixteenth IEEE International Symposium on
Conference_Location
Nara
ISSN
1099-4734
Print_ISBN
978-1-4244-1334-8
Electronic_ISBN
1099-4734
Type
conf
DOI
10.1109/ISAF.2007.4393244
Filename
4393244
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