• DocumentCode
    2276602
  • Title

    Influence of trace water and oxygen on characteristic decomposed components of SF6 under partial discharge

  • Author

    Fuping, Zeng ; Ju, Tang ; Xiaoxing, Zhang

  • Author_Institution
    State Key Lab. of Power Transm. Equip. & Syst. Security & New Technol., Chongqing, China
  • fYear
    2012
  • fDate
    17-20 Sept. 2012
  • Firstpage
    505
  • Lastpage
    508
  • Abstract
    Monitoring the contents of decomposed components of SF6 in order to identify the internal insulation faults of electrical equipment with SF6 dielectric is a common practice. Partial discharges (PDs) can lead to the decomposition of the SF6 dielectric. The new reactions also cause the final decomposed components to differ due to the different concentrations of H2O and O2 even under the same strength of PD. Thus, the accuracy of assessing inner insulation faults is affected when using the concentration and corresponding change of decomposed components. In this work, two main characteristic components SO2F2 and SOF2 was researched. The purpose is to perform influence analysis of trace H2O and O2 on the characteristic components. Research findings indicated that the amount of SOF2 strongly correlates to the amount of trace H2O, whereas the amount of SO2F2 is weakly related to trace H2O. Furthermore, the dilution effect of trace O2 on SOF2 obviously exceeds that on SO2F2.
  • Keywords
    SF6 insulation; fault diagnosis; monitoring; partial discharges; power apparatus; water; H2O; O2; PD; SF6 dielectric decomposition; SO2F2; SOF2; content monitoring; decomposed component; electrical equipment; influence analysis; insulation fault; partial discharge; trace water; Chemicals; Discharges (electric); Electrodes; Partial discharges; Sulfur hexafluoride; Water;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    High Voltage Engineering and Application (ICHVE), 2012 International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    978-1-4673-4747-1
  • Type

    conf

  • DOI
    10.1109/ICHVE.2012.6357037
  • Filename
    6357037