DocumentCode :
2277083
Title :
Transparency improvement of force-reflecting teleoperation over time-varying network delays
Author :
Lee, Seokhee ; Kim, JongWon ; Ishibashi, Yutaka
Author_Institution :
Networked Media Lab., Gwangju Inst. of Sci. & Technol., Gwangju, South Korea
fYear :
2010
fDate :
19-23 July 2010
Firstpage :
1010
Lastpage :
1015
Abstract :
In this paper, we carry out a transparency (i.e., haptic realism) analysis and propose a haptic synchronization scheme for a force-reflecting teleoperation over time-varying network delay. Although previous researches proposed several haptic synchronization schemes to efficiently compensate for delay jitter, defining a proper synchronization delay for transparency improvement remains a challenge. Therefore, the transparency analysis quantifies the force feedback distortion caused by network delay and packet loss, and predicts the maximally allowable delay and loss for predefined transparency requirements. In order to minimize the force feedback distortion, the proposed haptic synchronization scheme controls the playout times of the delayed transmitted haptic events based on the transparency analysis. According to simulation and experimental results, the transparency analysis provides an acceptable quantification method about haptic interaction quality with respect to network delays and packet losses. It is also verified that the proposed scheme guarantees more transparent haptic interaction than existing synchronization schemes tailored for networked haptics.
Keywords :
delay circuits; force feedback; haptic interfaces; synchronisation; delay jitter; force feedback distortion; force-reflecting teleoperation; haptic interaction quality; haptic synchronization scheme; quantification method; synchronization delay; time-varying network delay; Delay; Force; Force feedback; Robots; Synchronization; Tin; Force-reflecting teleoperation; haptic interactions; stability; synchronization; transparency;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Multimedia and Expo (ICME), 2010 IEEE International Conference on
Conference_Location :
Suntec City
ISSN :
1945-7871
Print_ISBN :
978-1-4244-7491-2
Type :
conf
DOI :
10.1109/ICME.2010.5582552
Filename :
5582552
Link To Document :
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