Title :
Highly sensitive direct femtosecond pulse measurements using electrooptic spectral shearing interferometry
Author :
Dorrer, C. ; Inuk Kang
Author_Institution :
Lucent Technol. Bell Labs., Holmdel, NJ, USA
Abstract :
Highly sensitive femtosecond optical pulse characterization has been performed, for the first time to our knowledge, using electrooptic spectral shearing interferometry. We report a full temporal characterization of 750-fs pulses with average power as low as 10 /spl mu/W at 156-MHz repetition rate.
Keywords :
electro-optical effects; high-speed optical techniques; laser mode locking; laser variables measurement; light interferometry; sensitivity; 10 muW; 750 fs; average power; electrooptic spectral shearing interferometry; full temporal characterization; highly sensitive direct femtosecond pulse measurements; ultrafast optical pulse characterization; Fiber nonlinear optics; Optical interferometry; Optical pulse generation; Optical pulses; Optical sensors; Phase modulation; Pulse measurements; Pulse modulation; Shearing; Ultrafast optics;
Conference_Titel :
Lasers and Electro-Optics, 2002. CLEO '02. Technical Digest. Summaries of Papers Presented at the
Conference_Location :
Long Beach, CA, USA
Print_ISBN :
1-55752-706-7
DOI :
10.1109/CLEO.2002.1034471
