DocumentCode
227733
Title
Micro-mechanical characterization of lead-free solder joints in power electronics
Author
Jules, Samuel ; Ryckelynck, David ; Duhamel, Cecilie ; Bienvenu, Yves ; Bisson, Jean-Francois ; Leon, R.
Author_Institution
Centre des Mater., MINES ParisTech, Evry, France
fYear
2014
fDate
27-30 May 2014
Firstpage
107
Lastpage
111
Abstract
The following study is motivated by the need to capture the elasto-viscoplastic behavior of a “real” industrial power module lead-free solder joint. In this work, we carried out a numerical design of experiments in order to forecast the ability of an experimental bending system to identify the specimen material properties. As a proof of principle, the micro-mechanical elastic behavior of power module copper substrates was then characterized thanks to the development of an innovative in-situ micro-mechanical bending test under an optical profilometer. An inverse Finite-Element Method has been applied in order to identify the material properties of test specimens designed directly out of industrial assemblies and not from bulk solder for good representativity. The results show that identified copper Young´s modulus values are lower than that of a bulk material. It will be defined as such in the next identificatio n step targeting the solder joint.
Keywords
Young´s modulus; bending; copper; design of experiments; elasticity; finite element analysis; mechanical testing; power electronics; solders; viscoplasticity; Young modulus; design of experiments; elasto-viscoplastic behavior; inverse finite element method; micromechanical bending test; micromechanical elastic behavior; optical profilometer; power electronics; solder joints; Copper; Lead; Materials; Numerical models; Soldering; Strain; Tensile stress; Lead-free solder; finite element; inverse method; material properties; parameter identification; power electronic;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2014 IEEE Intersociety Conference on
Conference_Location
Orlando, FL
ISSN
1087-9870
Type
conf
DOI
10.1109/ITHERM.2014.6892271
Filename
6892271
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