• DocumentCode
    227733
  • Title

    Micro-mechanical characterization of lead-free solder joints in power electronics

  • Author

    Jules, Samuel ; Ryckelynck, David ; Duhamel, Cecilie ; Bienvenu, Yves ; Bisson, Jean-Francois ; Leon, R.

  • Author_Institution
    Centre des Mater., MINES ParisTech, Evry, France
  • fYear
    2014
  • fDate
    27-30 May 2014
  • Firstpage
    107
  • Lastpage
    111
  • Abstract
    The following study is motivated by the need to capture the elasto-viscoplastic behavior of a “real” industrial power module lead-free solder joint. In this work, we carried out a numerical design of experiments in order to forecast the ability of an experimental bending system to identify the specimen material properties. As a proof of principle, the micro-mechanical elastic behavior of power module copper substrates was then characterized thanks to the development of an innovative in-situ micro-mechanical bending test under an optical profilometer. An inverse Finite-Element Method has been applied in order to identify the material properties of test specimens designed directly out of industrial assemblies and not from bulk solder for good representativity. The results show that identified copper Young´s modulus values are lower than that of a bulk material. It will be defined as such in the next identificatio n step targeting the solder joint.
  • Keywords
    Young´s modulus; bending; copper; design of experiments; elasticity; finite element analysis; mechanical testing; power electronics; solders; viscoplasticity; Young modulus; design of experiments; elasto-viscoplastic behavior; inverse finite element method; micromechanical bending test; micromechanical elastic behavior; optical profilometer; power electronics; solder joints; Copper; Lead; Materials; Numerical models; Soldering; Strain; Tensile stress; Lead-free solder; finite element; inverse method; material properties; parameter identification; power electronic;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2014 IEEE Intersociety Conference on
  • Conference_Location
    Orlando, FL
  • ISSN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2014.6892271
  • Filename
    6892271