• DocumentCode
    2278558
  • Title

    The effect of interface reaction with different finishes and SnAgCu on the reliability of solder joints

  • Author

    Zhou Peng ; Jiang Ting-biao ; Yang Dao-guo ; You Zhi ; Ma Ya-hui ; Ren Rong-bin

  • Author_Institution
    Guilin Univ. of Electron. Technol., Guilin, China
  • fYear
    2010
  • fDate
    16-19 Aug. 2010
  • Firstpage
    998
  • Lastpage
    1002
  • Abstract
    BGA device is always inefficient for its solder joints, of which part the interface intermetallic compounds (IMC) is most likely to crack. What´s more, interfacial reactions are becoming more complex these days as the lead-free alternative becoming an urgent requirement for electronic industry and various materials being applied in electronics packaging application. Taking account of the above reasons, it´s of great significance to take out a research on the influence of IMC on the reliability of the BGA product. This thesis mainly concerns on different kinds of IMC formed under different PCB plating layer and the effects of those IMCs on the reliability of the solder joints. Large amount of statistics show that most of the electronic components lost their efficacy under the instantaneous momentum and the thermal stress. Hence this thesis has investigated the reliability of interconnections between SBGA and PCB with different plating layer under drop test and temperature cycling test. After each stage of the test, add up the number of cracking solder joints by X-ray. Then, the components were made of metallographic samples, and the phases of different IMCs were identified by Energy Dispersive X-ray (EDX) and Scanning Electron Microscope (SEM). Some were tested using the red dye penetration method. By analyzing the experiment and simulation, it is found that: (1) The solder paste reliability of the SBGA components reflowed on the OSP and EING finish boards were significantly better than that of the components soldered on HASL and Immersion Ag boards for drop test. SBGA components failed sooner for the boards with Immersion Ag pad finishes. The initial reliability of the SnAgCu solder on ENIG finish boards is greater than that of the SnPb solder shifting the failures to the PCB, and the SnPb solder on OSP, HASL and Immersion Ag is better than that of the SnAgCu solder. (2) The solder joints have the best strength when using the ENIG finishes and comparatively less w- - hen using the OSP finishes for temperature cycling. What´s more, when using the HASL finishes, the solderability is the best and the Immersion Ag finishes is the worst. The overall strength of the SnAgCu solder is greater than that of the SnPb solder after the temperature cycling.
  • Keywords
    ball grid arrays; reliability; solders; BGA device; BGA product; SnAgCu; electronic component; electronic industry; electronics packaging; energy dispersive X-ray; interface intermetallic compound; interface reaction; interfacial reaction; red dye penetration method; scanning electron microscope; solder joint reliability; solder paste reliability; solderability; temperature cycling test; thermal stress; Copper; Electronics packaging; Intermetallic; Lead; Packaging; Reliability; Soldering; drop test; intermetallic compounds; plating layer; temperature cycling test;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-8140-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2010.5582630
  • Filename
    5582630