Title :
A tool for automatic generation of self-checking data paths
Author :
Hamdi, B. ; Bederr, H. ; Nicolaidis, M.
fDate :
30 Apr-3 May 1995
Abstract :
An important drawback of implementing self-checking circuits concerns the lack of dedicated CAD tools. This problem results on a significant increasing of the design effort and compromises the interest of such designs. CAD tools aimed to implement self-checking data paths is of high interest since data-paths are basic parts of microprocessors and microcontrollers. The tools presented here include generators of self-checking adders, ALUs, multipliers, dividers, shifters and register files, as well as generators of parity and double rail checkers. Another tool interconnects these blocks to generate the self-checking data-path
Keywords :
automatic test software; built-in self test; circuit CAD; circuit testing; logic testing; ALUs; CAD tools; adders; automatic generation; circuit design; dividers; double rail checkers; microcontrollers; microprocessors; multipliers; parity checkers; register files; self-checking data paths; shifters; Adders; Circuit faults; Design automation; Digital arithmetic; Hardware; Integrated circuit reliability; Microcontrollers; Microprocessors; Positron emission tomography; Rails;
Conference_Titel :
VLSI Test Symposium, 1995. Proceedings., 13th IEEE
Conference_Location :
Princeton, NJ
Print_ISBN :
0-8186-7000-2
DOI :
10.1109/VTEST.1995.512675