Scaling of SMP diode performance with geometry and voltage

Author

Kiefer, Mark L. ; Johnston, Mark D. ; Webb, Timothy J. ; Leckbee, Joshua J. ; Renk, Timothy J. ; Oliver, Bryan V. ; Mazarakis, Michael G. ; Nielsen, Dan S. ; Ziska, Derek ; Lake, Patrick W. ; Bennett, N.L. ; Gignac, R.E. ; Smith, Chase C. ; Droemer, Darry

Author_Institution

Sandia Nat. Labs., Albuquerque, NM, USA

fYear

2014

fDate

25-29 May 2014

Firstpage

1

Lastpage

1

Abstract

The self-magnetic pinch (SMP) electron beam diode has been studied extensively as an intense, flash x-ray, radiographic source at Sandia National Laboratories. It has been fielded across a wide range of voltages and geometric configurations on the Radiographic Integrated Test Stand (RITS-6) inductive voltage adder accelerator and the Ursa Minor 21-cavity linear transformer driver accelerator. We present the observed scaling and reproducibility behavior of the SMP diode with variations in voltage and geometry, as well as effects of various materials used in the diode. With the proper configurations, we have observed excellent performance from the SMP diode at up to 8 MV with indications of improvement at even higher voltages. Proposed physical underpinnings of this behavior, based on measurements, analysis and numerical simulation, will be presented.

Keywords

electron beams; linear accelerators; numerical analysis; particle beam diagnostics; Radiographic Integrated Test Stand inductive voltage adder accelerator; Sandia National Laboratories; Ursa Minor 21-cavity linear transformer driver accelerator; geometric configurations; intense flash X-ray radiographic source; numerical simulation; reproducibility behavior; self-magnetic pinch electron beam diode performance; Electron beams; Geometry; Laboratories; Lakes; Life estimation; National security; Radiography;

fLanguage

English

Publisher

ieee

Conference_Titel

Plasma Sciences (ICOPS) held with 2014 IEEE International Conference on High-Power Particle Beams (BEAMS), 2014 IEEE 41st International Conference on

Conference_Location

Washington, DC

Print_ISBN

978-1-4799-2711-1

Type

conf

DOI

10.1109/PLASMA.2014.7012695

Filename

7012695