• DocumentCode
    228088
  • Title

    Cross plane thermal conductance of graphene-metal interfaces

  • Author

    Vasquez Guzman, Pablo A. ; Sood, Aditya ; Mleczko, Michal J. ; Wang, Bingdong ; Wong, H.-S Philip ; Nishi, Yoshio ; Asheghi, Mehdi ; Goodson, Kenneth E.

  • Author_Institution
    Dept. of Mech. Eng., Stanford Univ., Stanford, CA, USA
  • fYear
    2014
  • fDate
    27-30 May 2014
  • Firstpage
    1385
  • Lastpage
    1389
  • Abstract
    We present an experimental study of cross-plane thermal conductance in metal-graphene-oxide stacks employing time-domain thermoreflectance (TDTR) measurements on Al/m/graphene/SiO2 structures with monolayer graphene for varying adhesion metals m. Thermal conductance G in the range of 15-60 MWm-2K-1 are found across several metals - a two-to-fourfold decrease over Al/m/SiO2 reference values, charted against metal Debye temperature over a 274-630 K range, as well as electronic work function. The results of this study help with a better understanding of the roles of electron and phonon transport in thermal conduction across graphene-metal interfaces, revealing potential trade-offs between electrical contact resistance and heat management in graphene devices.
  • Keywords
    Debye temperature; aluminium; contact resistance; graphene; heat conduction; silicon compounds; surface conductivity; thermoreflectance; work function; Al-SiO2; C; Debye temperature; TDTR; cross-plane thermal conductance; electrical contact resistance; electronic work function; graphene-metal interfaces; heat management; metal-graphene-oxide stacks; monolayer graphene; temperature 274 K to 630 K; time-domain thermoreflectance measurements; Adhesives; Films; Graphene; Metals; Temperature measurement; Thermal conductivity; Thermal resistance; Debye temperature; Graphene; metal work function; thermal conductance; time-domain thermoreflectance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermal and Thermomechanical Phenomena in Electronic Systems (ITherm), 2014 IEEE Intersociety Conference on
  • Conference_Location
    Orlando, FL
  • ISSN
    1087-9870
  • Type

    conf

  • DOI
    10.1109/ITHERM.2014.6892441
  • Filename
    6892441