Title :
Energy and performance analysis of mapping parallel multi-threaded tasks for an on-chip multi-processor system
Author :
Lai, Bo-Cheng Charles ; Schaumont, Patrick ; Qin, Wei ; Verbauwhede, Ingrid
Author_Institution :
Dept. of Electr. Eng., California Univ., Los Angeles, CA, USA
Abstract :
Multiprocessor systems offer superior performance and potentially better energy-reduction than single-processor systems. It all depends, however, on how well the application can be mapped onto the architecture. Indeed, a careful tradeoff of energy and performance requires a thorough understanding of the energy consumption pattern of the application across the architecture. We develop a simulation platform, MultiPo-Sim, which returns the cycle-accurate performance and energy consumption of a multiprocessor system, for both hardware components and software primitives. On the hardware level, energy scaling techniques can be modeled and each processing core can operate at different energy modes. MultiPo-Sim achieves 331K cycles per second simulation speed for a four-processor system on a 3GHz, 512MByte Fedora-2 PC. On the software level, data parallelizing and task parallelizing are two common models of multi-thread programming. By using MultiPo-Sim, we show that they show different energy and performance characteristics when mapping onto a multi-processor system.
Keywords :
logic design; microprocessor chips; multi-threading; multiprocessing systems; parallel processing; 3 GHz; MultiPo-Sim; data parallelizing; energy consumption pattern; energy scaling techniques; multithread programming; on-chip multiprocessor system; parallel multithreaded tasks; processing core; simulation platform; single-processor systems; task parallelizing; Application software; Computer architecture; Energy consumption; Hardware; Multiprocessing systems; Performance analysis; Power system modeling; Software performance; System-on-a-chip; Yarn;
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 2005. ICCD 2005. Proceedings. 2005 IEEE International Conference on
Print_ISBN :
0-7695-2451-6
DOI :
10.1109/ICCD.2005.47