Title :
Problems and solutions applying high speed fuses in the past and the future
Author :
Andersen, Niels C.
Author_Institution :
Bussmann Div., Copper Ind., St. Louis, MO, USA
Abstract :
The development of high-speed fuses for the protection of high-power semiconductors is reviewed. The North American and European standards for the high-speed fuses are compared, and the effects of the different sets of standards are discussed.<>
Keywords :
electric fuses; protection; standards; European standards; North American standards; high speed fuses; high-power semiconductor protection; Aluminum; Copper; Digital TV; Fuses; Protection; Semiconductor diodes; Silver; Solid state circuits; Thyristors; Voltage;
Conference_Titel :
Industry Applications Society Annual Meeting, 1990., Conference Record of the 1990 IEEE
Conference_Location :
Seattle, WA, USA
Print_ISBN :
0-87942-553-9
DOI :
10.1109/IAS.1990.152414
