DocumentCode :
2282183
Title :
Error-tolerance memory microarchitecture via dynamic multithreading redundancy
Author :
Wang, Lei
Author_Institution :
Dept. of Electr. & Comput. Eng., Connecticut Univ., Storrs, CT, USA
fYear :
2005
fDate :
2-5 Oct. 2005
Firstpage :
179
Lastpage :
184
Abstract :
Presented in this paper is an error-tolerance multithreaded register file microarchitecture that employs dynamic multithreading redundancy for error control. The proposed technique is based on the observation that concurrent threads may not access a register entry simultaneously. The non-overlapped register access patterns create hardware redundancy dynamically that can be exploited for error control. This significantly improves access time during error recovery. Simulation results of a generic simultaneous multithreading processor on the SPEC CPU2000 benchmark programs demonstrate 13.8% to 50.7% reduction in register read access overheads subject to 2% hardware overheads. The proposed error-tolerance memory microarchitecture features good scalability for future microprocessor generations, where soft errors are expected to get worse with semiconductor process scaling.
Keywords :
logic design; memory architecture; microprocessor chips; multi-threading; redundancy; SPEC CPU2000 benchmark programs; dynamic multithreading redundancy; error recovery; error-tolerance memory microarchitecture; hardware redundancy; microprocessor generations; multithreaded register file microarchitecture; multithreading processor; register access patterns; semiconductor process scaling; soft errors; Computer errors; Microarchitecture; Multithreading;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Computer Design: VLSI in Computers and Processors, 2005. ICCD 2005. Proceedings. 2005 IEEE International Conference on
Print_ISBN :
0-7695-2451-6
Type :
conf
DOI :
10.1109/ICCD.2005.50
Filename :
1524150
Link To Document :
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