• DocumentCode
    2282452
  • Title

    Microstructure and solderability of Sn-3.5Ag-0.5Cu-xBi-ySb solders

  • Author

    Lu, Sheng ; Zheng, Zhixia ; Chen, Jing ; Luo, Fei

  • Author_Institution
    Dept. of Welding & Mater. Forming, Jiangsu Univ. of Sci. & Technol., Zhenjiang, China
  • fYear
    2010
  • fDate
    16-19 Aug. 2010
  • Firstpage
    410
  • Lastpage
    412
  • Abstract
    Lead-free solders were prepared by adding a small quantity of Bi, Sb element into Sn-3.5Ag-0.5Cu alloy. By means of OM, SEM, EDS, DTA and solderability test, effects of Bi and Sb elements on microstructure, solderability and melting characteristic were investigated. The results show that with the increase of Bi and Sb addition into Sn-3.5Ag-0.5Cu solder, the primary β-Sn phrase decreased gradually and tiny inter-metallic compounds increased. Bi presents obvious effects on depressing the melting temperature but broadening the melting range. And the addition of Sb has little effect on melting temperature but broadens the melting range too. Adding suitable amount of Bi and Sb into the solder alloy may help improve the solderability.
  • Keywords
    X-ray chemical analysis; alloying additions; antimony alloys; bismuth alloys; copper alloys; crystal microstructure; differential thermal analysis; melting point; optical microscopy; scanning electron microscopy; silver alloys; soldering; solders; tin alloys; Bi element addition effects; DTA; EDS; OM; SEM; Sb element addition effects; SnAgCuBiSb; differential thermal analysis; energy-dispersive spectroscopy; intermetallic compounds; lead-free solders; melting range; melting temperature; microstructure; optical microscopy; primary β-Sn phase; scanning electron microscopy; solderability test; Bismuth; Compounds; Lead; Microstructure; Soldering; Tin; Sn-Ag-Cu-Bi-Sb lead-free solder; melting temperature; microstructure; solderability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology & High Density Packaging (ICEPT-HDP), 2010 11th International Conference on
  • Conference_Location
    Xi´an
  • Print_ISBN
    978-1-4244-8140-8
  • Type

    conf

  • DOI
    10.1109/ICEPT.2010.5582854
  • Filename
    5582854