Title :
Synthesis and characterization of silicon carbide (SiC) microstructures
Author :
Legba, E. Thymour ; Olida, Nikki ; Hunley, D. Patrick ; Omer, Ingrid St
Author_Institution :
Dept. of Electr. & Comput. Eng., Kentucky Univ., Lexington, KY
Abstract :
The purpose of this research was to synthesize and physically characterize silicon carbide microtubes. This was done by reacting silicon monoxide (SiO) powder with multi-walled carbon nanotubes (MWCNTs) at high temperature. Several experiments were conducted under vacuum in a high-temperature furnace varying temperature (1300degC-1450degC), time and reactant material mass. The resulting samples were then physically characterized using X-ray diffraction (XRD) and scanning electron microscopy (SEM). XRD analysis revealed the presence of dominant beta-silicon carbide phases. SEM images revealed a unique morphology in comparison with the starting materials.
Keywords :
X-ray diffraction; carbon nanotubes; powders; scanning electron microscopy; silicon compounds; SiC; SiO; X-ray diffraction; multi-walled carbon nanotubes; scanning electron microscopy; silicon carbide microstructures; silicon monoxide powder; Carbon nanotubes; Conducting materials; Furnaces; Microstructure; Powders; Scanning electron microscopy; Silicon carbide; Temperature; X-ray imaging; X-ray scattering;
Conference_Titel :
SoutheastCon, 2007. Proceedings. IEEE
Conference_Location :
Richmond, VA
Print_ISBN :
1-4244-1028-2
Electronic_ISBN :
1-4244-1029-0
DOI :
10.1109/SECON.2007.343008
