DocumentCode
2283522
Title
Surface cleaning techniques and efficient B-field profiles for lithium ion sources on extraction ion diodes
Author
Cuneo, M.E. ; Menge, P.R. ; Hanson, D.L. ; Bailey, J.E. ; Bernard, M.A. ; Desjarlais, M.P. ; Filuk, A.B. ; Fowler, W.E. ; Lockner, T.R. ; Nash, T.J. ; Noack, D.D. ; Slutz, S.A. ; Ziska, G.R.
Author_Institution
Sandia Nat. Labs., Albuquerque, NM, USA
fYear
1995
fDate
5-8 June 1995
Firstpage
178
Abstract
Summary form only given. Application of ion beams to inertial confinement fusion requires efficient production, transport and focusing of an intense, low microdivergence beam of an appropriate range ion. At Sandia, we are studying the production of lithium ion beams in extraction applied-B ion diodes on the SABRE accelerator (5 MV, 250 kA). Evidence on both SABRE (1 TW) and PBFA-II (20 TW) indicates that the lithium beam turns off and is replaced by a beam of mostly protons and carbon, possibly due to election thermal and stimulated desorption of hydrocarbon surface contamination with subsequent avalanche ionization. Turn-off of the lithium beam is accompanied by rapid impedance collapse. Surface cleaning techniques are being developed to reduce beam contamination, increase the total lithium energy and reduce the rate of diode impedance collapse. Application of surface cleaning techniques has increased the production of lithium from passive LiF sources by a factor of 2. Improved diode electric and magnetic field profiles have increased the diode efficiency and production of lithium by a factor of 5, without surface cleaning. Work is ongoing to combine these two advances. Our principal surface cleaning technique consists of 13.5 MHz RF and RF-assisted discharges for efficient physical and chemical sputtering of surface impurities from both the anode and cathode.
Keywords
beam handling techniques; electron stimulated desorption; ion beams; ion sources; lithium; particle beam focusing; plasma diodes; sputtering; surface cleaning; thermally stimulated desorption; 1 TW; 13.5 MHz; 20 TW; 250 kA; 5 MV; B-field profiles; Li; Li beam turn-off; Li ion sources; PBFA-II; RF discharges; SABRE accelerator; avalanche ionization; beam contamination reduction; chemical sputtering; election thermal desorption; electric field profiles; extraction ion diodes; hydrocarbon surface contamination; inertial confinement fusion; intense low microdivergence ion beam; ion beam focusing; ion beam production; ion beam transport; ion beams; magnetic field profiles; passive LiF sources; physical sputtering; stimulated desorption; surface cleaning techniques; surface impurities; Diodes; Inertial confinement; Ion beams; Lithium; Particle beams; Production; Surface cleaning; Surface contamination; Surface discharges; Surface impedance;
fLanguage
English
Publisher
ieee
Conference_Titel
Plasma Science, 1995. IEEE Conference Record - Abstracts., 1995 IEEE International Conference on
Conference_Location
Madison, WI, USA
ISSN
0730-9244
Print_ISBN
0-7803-2669-5
Type
conf
DOI
10.1109/PLASMA.1995.531666
Filename
531666
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