• DocumentCode
    2284033
  • Title

    Passive FIR filter design using reflections from stubs for high speed links

  • Author

    Cheng, Yung-Shou ; Wu, Ruey-Beei

  • Author_Institution
    Dept. of Electr. Eng., Nat. Taiwan Univ., Taipei, Taiwan
  • fYear
    2011
  • fDate
    12-14 Dec. 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    In the demand of multi-gigabit data transmission, finite-impulse response (FIR) filter as transmitter with de-emphasis has been extensively used to mitigate the inter-symbol interference (ISI) resulted from the skin effect and dielectric dispersion. In this paper, a passive FIR filter design is proposed to realize the de-emphasis performance by taking advantage of reflection under additional stub. A predictive method for received eye diagram performance, based on step response of interconnect system, is introduced to determine the optimal tap coefficients. The relation between the synthesized tap coefficient and the corresponding design variables [RT1, Z1, Z2] is well established to facilitate the filter design. The proposed FIR filter design has the advantage of reducing the power consumption of the circuits and achieving eye diagram improvement efficiently.
  • Keywords
    FIR filters; data communication; intersymbol interference; passive filters; skin effect; de-emphasis performance; dielectric dispersion; eye diagram improvement; finite-impulse response filter; high speed links; inter-symbol interference; interconnect system; multi-gigabit data transmission; optimal tap coefficients; passive FIR filter design; power consumption; predictive method; received eye diagram performance; skin effect; step response; transmitter; Data communication; Finite impulse response filter; Impedance; Power transmission lines; Propagation losses; Reflection; Resistance; De-emphasis; FIR filter; eye diagram; frequency-dependent loss; inter-symbol interference;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Design of Advanced Packaging and Systems Symposium (EDAPS), 2011 IEEE
  • Conference_Location
    Hanzhou
  • ISSN
    2151-1225
  • Print_ISBN
    978-1-4673-2288-1
  • Electronic_ISBN
    2151-1225
  • Type

    conf

  • DOI
    10.1109/EDAPS.2011.6213753
  • Filename
    6213753