DocumentCode
2284075
Title
Interlaboratory comparison using a transport Josephson voltage standard system
Author
Tang, Y. ; Kupferman, S.L. ; Salazar, M.T.
Author_Institution
Nat. Inst. of Stand. & Technol., Gaithersburg, MD, USA
fYear
2002
fDate
16-21 June 2002
Firstpage
394
Lastpage
395
Abstract
A portable Josephson voltage standard (JVS) system has been used as a transfer standard to make an interlaboratory JVS comparison. The results are compared with an interlaboratory comparison between the same two JVS systems using transport Zeners made at about the same time. The portable JVS improves the uncertainty of the comparison by largely eliminating the problem associated with non-ideal Zener transportability, environmental dependence, and non-linear drift.
Keywords
Josephson effect; Zener effect; superconducting junction devices; transfer standards; voltage measurement; environmental dependence; interlaboratory JVS comparison; nonideal Zener transportability; nonlinear drift; portable Josephson voltage standard system; transport Josephson voltage standard system; transport Zeners; voltage transfer standard; Automatic control; Calibration; Control systems; Laboratories; Measurement standards; NASA; NIST; Switches; US Department of Energy; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
Conference_Location
Ottawa, Ontario, Canada
Print_ISBN
0-7803-7242-5
Type
conf
DOI
10.1109/CPEM.2002.1034888
Filename
1034888
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