• DocumentCode
    2284187
  • Title

    Experimental sampling distributions of the Allan variance in DC electrical measurements

  • Author

    Witt, T.J.

  • Author_Institution
    Bur. Int. des Poids et Mesures, Sevres, France
  • fYear
    2002
  • fDate
    16-21 June 2002
  • Firstpage
    412
  • Lastpage
    413
  • Abstract
    Stochastic serial correlations in DC measurements can be characterized using the Allan variance. Indeed, the Allan variance can be used to characterize the stability of instruments themselves. For such applications it is useful to be able to specify its uncertainty. By repeating sets of 2048 observations more than 500 times in succession, the experimental sampling distribution of the Allan variance was obtained and found to agree well with the chi-square distribution calculated from the number of degrees of freedom estimated from the data.
  • Keywords
    correlation methods; measurement standards; measurement uncertainty; stochastic processes; voltage measurement; Allan variance; DC electrical measurements; chi-square distribution; degrees of freedom; measurement instrument stability; measurement uncertainty; sampling distributions; stochastic serial correlations; Electric variables measurement; Frequency; Instruments; Noise measurement; Sampling methods; Stability; Stochastic processes; Voltage; Voltmeters; White noise;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Precision Electromagnetic Measurements, 2002. Conference Digest 2002 Conference on
  • Conference_Location
    Ottawa, Ontario, Canada
  • Print_ISBN
    0-7803-7242-5
  • Type

    conf

  • DOI
    10.1109/CPEM.2002.1034895
  • Filename
    1034895