• DocumentCode
    2284543
  • Title

    Efficient electromagnetic simulation of angled interconnection pattern by conformal- and HIE-FDTD methods

  • Author

    Muraoka, Hideaki ; Unno, Masaki ; Aono, Shuichi ; Asai, Hideki

  • Author_Institution
    Dept. of Syst. Eng., Shizuoka Univ., Hamamatsu, Japan
  • fYear
    2011
  • fDate
    12-14 Dec. 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Due to orthogonal grids in conventional finite-difference time-domain (FDTD) methods, difficulty in modeling a complicated structure results in incomplete discretization of space. Therefore, it is inherently difficult to analyze thin structures such as a printed circuit board (PCB) and curved or angled patterns such as interconnection patterns on the PCB. In this paper, we propose an effective electromagnetic simulation technique which is constructed by combining the conformal FDTD (CFDTD) method and the hybrid implicit-explicit (HIE)-FDTD method. The proposed technique can circumvent the above problems by exploiting advantages of the HIE-FDTD method and the CFDTD method. An example model of the interconnection pattern is analyzed by the proposed and conventional methods, and we estimate the accuracy and CPU time of the proposed one.
  • Keywords
    finite difference time-domain analysis; integrated circuit interconnections; printed circuits; HIE-FDTD method; angled interconnection pattern; angled patterns; conformal FDTD method; curved patterns; electromagnetic simulation; finite-difference time-domain method; hybrid implicit-explicit FDTD method; orthogonal grids; printed circuit board; thin structures; Accuracy; Finite difference methods; Integrated circuit interconnections; Integrated circuit modeling; Solid modeling; Time domain analysis;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Design of Advanced Packaging and Systems Symposium (EDAPS), 2011 IEEE
  • Conference_Location
    Hanzhou
  • ISSN
    2151-1225
  • Print_ISBN
    978-1-4673-2288-1
  • Electronic_ISBN
    2151-1225
  • Type

    conf

  • DOI
    10.1109/EDAPS.2011.6213777
  • Filename
    6213777