• DocumentCode
    2284560
  • Title

    Nanofork and Line-patterned Substrate for measuring single cells adhesion force inside ESEM

  • Author

    Ahmad, Mohd Ridzuan ; Nakajima, Masahiro ; Kojima, Masaru ; Kojima, Seiji ; Homma, Michio ; Fukuda, Toshio

  • Author_Institution
    Dept. of Mechatron. & Robot., Univ. Teknol. Malaysia, Skudai, Malaysia
  • fYear
    2010
  • fDate
    17-20 Aug. 2010
  • Firstpage
    356
  • Lastpage
    359
  • Abstract
    In this paper, single cell adhesion force was measured using a nanofork. The nanofork was used to pick-up a single cell on a line-patterned substrate inside ESEM. The line-patterned substrate was used to provide small gaps between the single cells and the substrate. Therefore, the nanofork could be inserted through these gaps in order to successfully pick-up a single cell. Adhesion force was measured during the cell pick-up process from the deflection of the cantilever beam. The nanofork was fabricated using focused ion beam (FIB) etching process while the line-patterned substrate was fabricated using nanoimprinting technology. As to investigate the effect of contact area on the strength of the adhesion force, two sizes of gap distance of line-patterned substrate were used, i.e. 1 μm and 2 μm. Results showed that cells attached on the 1 μm gap line-patterned substrate required more force to be released as compared to the cells attached on the 2 μm gap line-patterned substrate.
  • Keywords
    adhesion; biological techniques; biomechanics; cellular biophysics; force measurement; nanobiotechnology; scanning electron microscopy; ESEM; adhesion force strength; contact area; focused ion beam etching; line-pattemed substrate; nanofork; nanoimprinting technology; single cell adhesion force measurement;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2010 10th IEEE Conference on
  • Conference_Location
    Seoul
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4244-7033-4
  • Electronic_ISBN
    1944-9399
  • Type

    conf

  • DOI
    10.1109/NANO.2010.5697764
  • Filename
    5697764