• DocumentCode
    2285387
  • Title

    Drift compensation technique of an area-varying capacitive displacement sensor for nanometer resolution

  • Author

    Kang, Daesil ; Lee, Wongoo ; Moon, Wonkyu

  • Author_Institution
    Mech. Eng. Dept., POSTECH, Pohang, South Korea
  • fYear
    2010
  • fDate
    17-20 Aug. 2010
  • Firstpage
    718
  • Lastpage
    721
  • Abstract
    Since a widely-used gap variation type capacitive displacement sensor has small measurable range, an area-variation type capacitive displacement sensor was proposed for a larger measurable range. The area-variation type sensors, however, may show considerably large drifts in its out signals. The drift is thought to be caused by such parameters as stage alignment errors, thermal effects, external electric waves, etc. In this study, the drift is successfully reduced without loss in SNR (signal to noise ratio) by adopting two sets of electrodes.
  • Keywords
    capacitive sensors; displacement measurement; area varying capacitive displacement sensor; drift compensation technique; nanometer resolution; signal to noise ratio;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Nanotechnology (IEEE-NANO), 2010 10th IEEE Conference on
  • Conference_Location
    Seoul
  • ISSN
    1944-9399
  • Print_ISBN
    978-1-4244-7033-4
  • Electronic_ISBN
    1944-9399
  • Type

    conf

  • DOI
    10.1109/NANO.2010.5697811
  • Filename
    5697811