• DocumentCode
    2289299
  • Title

    Consideration of component failure mechanisms in the reliability assessment of electronic equipment-addressing the constant failure rate assumption

  • Author

    Mortin, David E. ; Krolewski, Jane G. ; Cushing, Michael J.

  • Author_Institution
    US Army Materiael Syst. Anal., Aberdeen Proving Ground, MD, USA
  • fYear
    1995
  • fDate
    16-19 Jan 1995
  • Firstpage
    54
  • Lastpage
    59
  • Abstract
    The assumption of the constant failure rate can lead to excessive costs and nonoptimum design decisions. As this paper shows, simply summing constant failure rates can produce results which are highly inaccurate. Highly inaccurate results can introduce significant error in decisions made in everything from product design to logistics support requirements such as spares and maintainers. The authors argue that if a shift is made from reliability accounting tasks to reliability engineering analysis, the ability to address hazard rates versus time based on root-cause failure mechanisms will become cost-effective and can become an integral part of the concurrent engineering approach to product development. The notion of the constant failure rate should no longer be accepted as a rule. Instead, statistical distributions and assumptions must be shown to be appropriate every time they are used. Simplicity alone is not a sufficient reason to use any given methodology or approach
  • Keywords
    circuit reliability; failure analysis; probability; product development; reliability theory; statistical analysis; component failure mechanisms; constant failure rate; cost-effectiveness; electronic equipment; error; hazard rates; logistics support; product design; product development; reliability accounting tasks; reliability assessment; reliability engineering analysis; root-cause failure mechanisms; statistical distributions; Concurrent engineering; Costs; Failure analysis; Hazards; Logistics; Maintenance; Product design; Product development; Reliability engineering; Statistical distributions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability and Maintainability Symposium, 1995. Proceedings., Annual
  • Conference_Location
    Washington, DC
  • ISSN
    0149-144X
  • Print_ISBN
    0-7803-2470-6
  • Type

    conf

  • DOI
    10.1109/RAMS.1995.513224
  • Filename
    513224