DocumentCode
2291266
Title
Impact of attribute selection on defect proneness prediction in OO software
Author
Mishra, Bharavi ; Shukla, K.K.
Author_Institution
Dept. of Comput. Eng., Banaras Hindu Univ., Varanasi, India
fYear
2011
fDate
15-17 Sept. 2011
Firstpage
367
Lastpage
372
Abstract
Defect proneness prediction of software modules always attracts the developers because it can reduce the testing efforts as well as software development time. In the current context, with the piling up of constraints like requirement ambiguity and complex development process, developing fault free reliable software is a daunting task. To deliver reliable software, software engineers are required to execute exhaustive test cases which become tedious and costly for software enterprises. To ameliorate the testing process one can use a defect prediction model so that testers can focus their efforts on defect prone modules. Building a defect prediction model becomes very complex task when the number of attributes is very large and the attributes are correlated. It is not easy even for a simple classifier to cope with this problem. Therefore, while developing a defect proneness prediction model, one should always be careful about feature selection. This research analyzes the impact of attribute selection on Naive Bayes (NB) based prediction model. Our results are based on Eclipse and KC1 bug database. On the basis of experimental results, we show that careful combination of attribute selection and machine learning apparently useful and, on the Eclipse data set, yield reasonable good performance with 88% probability of detection and 49% false alarm rate.
Keywords
Bayes methods; learning (artificial intelligence); object-oriented programming; program debugging; software reliability; Eclipse data set; KC1 bug database; OO software; attribute selection; complex development process; defect proneness prediction; machine learning; naive Bayes based prediction model; reliable software; requirement ambiguity; software development; software engineering; software enterprises; software modules; Complexity theory; Databases; Measurement; Niobium; Object oriented modeling; Predictive models; Software; Fault; Fault prediction; Metrics; Naive Bayes; Software Quality;
fLanguage
English
Publisher
ieee
Conference_Titel
Computer and Communication Technology (ICCCT), 2011 2nd International Conference on
Conference_Location
Allahabad
Print_ISBN
978-1-4577-1385-9
Type
conf
DOI
10.1109/ICCCT.2011.6075151
Filename
6075151
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