• DocumentCode
    229443
  • Title

    Via-adjusted microstrip launch for sub-terahertz wafer probing

  • Author

    Kooho Jung ; Ebner, John

  • Author_Institution
    Cascade Microtech Inc., Beaverton, OR, USA
  • fYear
    2014
  • fDate
    4-5 Dec. 2014
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A new design for a microstrip launch is proposed to improve the measurement repeatability at sub-THz frequencies. Performance improvement is achieved by adjusting the ground vias´ position to the rear of the launch by which it becomes less sensitive to probe-tip placement compared to conventional launches using microstrip or co-planer waveguides. The investigation was done using HFSS, 3-D finite-element-method based electromagnetic simulation software, with tight convergence criteria to meet the required tolerances. The proposed design can be applied to other RF interfaces that required high repeatability such as pads for wire-bonds and footprints for surface-mount components, without increasing cost or compromising RF performance.
  • Keywords
    coplanar waveguides; finite element analysis; lead bonding; vias; wafer bonding; 3D finite-element-method; HFSS; coplanar waveguides; electromagnetic simulation software; ground vias position; measurement repeatability; microstrip waveguides; subterahertz wafer probing; surfacemount components; via-adjusted microstrip launch; wire bonds; Calibration; Coplanar waveguides; Frequency measurement; Microstrip; Probes; Radio frequency; HFSS; coplanar-waveguide; launch; microstrip; probe; sub-THz; via;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Microwave Measurement Conference (ARFTG), 2014 84th ARFTG
  • Conference_Location
    Boulder, CO
  • Type

    conf

  • DOI
    10.1109/ARFTG.2014.7013409
  • Filename
    7013409