• DocumentCode
    2295705
  • Title

    Matching-Pursuits Based Feature Extraction with Reduced Aspect Sensitivity for Ultra Wide-band Radar Target Identification

  • Author

    Dangwei, Wang ; Xinyi, Ma ; Xinpu, Guan ; Shaogang, Wang ; Yi, Su

  • Author_Institution
    Sch. of Electron. Sci. & Eng., Nat. Univ. of Defense Technol., Changsha
  • fYear
    2006
  • fDate
    16-19 Oct. 2006
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents a matching-pursuits based technique to radar target feature extraction for aspect sensitivity reduce of template, including a training algorithm of the feature atom dictionary to characterize the target scattering. There is an important contribution in our technique that finite basis atoms, as features, are used to represent the complicatedly scattering behavior of the whole scattering waveform without any prior parameterization model hypothesis. Furthermore, as demonstrated in this paper, the proposed technique can reduce effectively aspect dependence of the extracted extraction for wide-angle target identification. Synthesized scattered responses and measured scattering signatures in a chamber are used to demonstrate the effectiveness of dictionary feature proposed in this paper
  • Keywords
    electromagnetic wave scattering; feature extraction; iterative methods; radar target recognition; time-frequency analysis; ultra wideband radar; aspect sensitivity; feature atom dictionary; feature extraction; matching-pursuit; measured scattering signature; radar target identification; scattered response; target scattering; training algorithm; ultra wide-band radar; Atomic measurements; Data mining; Dictionaries; Feature extraction; Matching pursuit algorithms; Optical scattering; Radar scattering; Scattering parameters; Ultra wideband radar; Ultra wideband technology; Target identification; feature extraction; matching pursuits;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radar, 2006. CIE '06. International Conference on
  • Conference_Location
    Shanghai
  • Print_ISBN
    0-7803-9582-4
  • Electronic_ISBN
    0-7803-9583-2
  • Type

    conf

  • DOI
    10.1109/ICR.2006.343376
  • Filename
    4148578