Title :
Analysis and Measurement of Capacitive Coupling in Integrated Circuits
Author :
Novak, J. ; Foit, J. ; Janicek, V.
Author_Institution :
Dept. of Microelectron., Czech Tech. Univ. in Prague, Prague
Abstract :
Parasitic electromagnetic couplings result in the transfer of interfering energy from the interference source to the interference receiver. Inside the IC´s the principal sources of interference are usually the clock circuits, output drivers and other circuits with low output impedance. The most frequent receivers of interference are the input circuits, flip-flops and circuits with high input impedance. The small distances of leads result in increased signal crosstalk inside the integrated circuit.
Keywords :
coupled circuits; integrated circuit measurement; interference (signal); capacitive coupling; clock circuits; flip-flops; input circuits; integrated circuits; interference receiver; interference source; output drivers; parasitic electromagnetic couplings; signal crosstalk; Clocks; Coupling circuits; Crosstalk; Driver circuits; Electromagnetic coupling; Electromagnetic interference; Electromagnetic measurements; Flip-flops; Impedance; Integrated circuit measurements;
Conference_Titel :
Advanced Semiconductor Devices and Microsystems, 2008. ASDAM 2008. International Conference on
Conference_Location :
Smolenice
Print_ISBN :
978-1-4244-2325-5
Electronic_ISBN :
978-1-4244-2326-2
DOI :
10.1109/ASDAM.2008.4743322