Local and Direct EM Injection of Power Into CMOS Integrated Circuits

Author

Poucheret, F. ; Tobich, K. ; Lisart, M. ; Chusseau, L. ; Robisson, B. ; Maurine, P.

Author_Institution

LIRMM, Montpellier, France

fYear

2011

fDate

28-28 Sept. 2011

Firstpage

100

Lastpage

104

Abstract

The paper aims at demonstrating experimentally that the tiny Electro Magnetic (EM) coupling between the tip end of a micro-antenna is sufficient to locally and directly inject power into CMOS Integrated Circuits (IC). More precisely, experimental results show that such electrical couplings are sufficient to disturb, with and without removing the IC package, the behavior of 90nm CMOS Ring Oscillators, a representative structure of CMOS logic but also a constituting element of some True Random Number Generators (TRNGs) or clock generator.

Keywords

CMOS integrated circuits; antennas; electromagnetic coupling; integrated circuit packaging; oscillators; power integrated circuits; random number generation; CMOS IC; CMOS integrated circuit; CMOS logic representative structure; CMOS ring oscillator; EM coupling; IC package; TRNG; clock generator; direct EM injection; electrical coupling; electromagnetic coupling; local EM injection; microantenna tip end; size 90 nm; true random number generator; CMOS integrated circuits; Circuit faults; Clocks; Generators; Probes; Wires; CMOS IC; EM Injection; Ring Oscillator; TNRG;

fLanguage

English

Publisher

ieee

Conference_Titel

Fault Diagnosis and Tolerance in Cryptography (FDTC), 2011 Workshop on

Conference_Location

Nara

Print_ISBN

978-1-4577-1463-4

Type

conf

DOI

10.1109/FDTC.2011.18

Filename

6076472