Title :
Multiresolution blind deconvolution of symmetric point-spread functions from bioelectrical potentials
Author_Institution :
Dept. of Electr. Eng. & Comput. Sci., Michigan Univ., Ann Arbor, MI
Abstract :
Cardiac muscle tissue consists of multiple, electrically-active layers, whose electrical potentials can be reconstructed from surface measurements as a volume conductor inverse problem. These are useful in diagnosis following myocardial infarction. The measurements include an unknown point-spread function, which must be blindly deconvolved from the bioelectrical potentials. We present a new divide-and-conquer approach to this problem: (1) unwrap the 2-D problem into a huge 1-D problem; (2) perform a multiresolution (subband) decomposition of the huge 1-D problem into small 1-D problems; (3) solve the small 1-D problems by finding the null vector of a Toeplitz-plus-Hankel matrix. Depending on the noise level, the polynomial Euclidian algorithm or structured total least squares may be used
Keywords :
Hankel matrices; Toeplitz matrices; bioelectric potentials; cardiology; image reconstruction; image resolution; inverse problems; medical image processing; optical transfer function; 1D problem; 2D problem; Toeplitz-plus-Hankel matrix; bioelectrical potentials; biomedical imaging; cardiac muscle tissue; divide-and-conquer approach; electrical potential reconstruction; electrically-active layers; image field reconstruction; multiresolution blind deconvolution; multiresolution subband decomposition; myocardial infarction; noise level; null vector; patient diagnosis; point-spread function; polynomial Euclidian algorithm; structured total least squares; surface measurements; symmetric point-spread functions; volume conductor inverse problem; Bioelectric phenomena; Conductors; Deconvolution; Electric potential; Electric variables measurement; Inverse problems; Muscles; Myocardium; Surface reconstruction; Volume measurement;
Conference_Titel :
Acoustics, Speech, and Signal Processing, 2000. ICASSP '00. Proceedings. 2000 IEEE International Conference on
Conference_Location :
Istanbul
Print_ISBN :
0-7803-6293-4
DOI :
10.1109/ICASSP.2000.860222