DocumentCode :
2299388
Title :
Comprehensive method to reduce PDW in arrayed-waveguide grating
Author :
Zhong, Fan ; Parhami, Farnaz ; Bornstein, J.G.
Author_Institution :
Lightwave Microsystems Corp., San Jose, CA, USA
fYear :
2002
fDate :
17-22 Mar 2002
Firstpage :
73
Lastpage :
75
Abstract :
Stress induced birefringence is the source of polarisation dependent wavelength (PDW) in AWGs. The reduction of thermally induced residual stress (the effective stress of the AWG device and the stress balance on the core and surrounding cladding) during the waveguide fabrication process is the key to minimizing PDW. Top clad stress, grating waveguide width and core density are the major parameters that influence the stress and resulting birefringence. Low PDW (less than 0.01 nm) can be manufactured by suitably selecting these parameters.
Keywords :
arrayed waveguide gratings; integrated optics; internal stresses; mechanical birefringence; optical communication equipment; optical fabrication; wavelength division multiplexing; AWG device; AWGs; PDW; birefringence; cladding; core density; effective stress; grating waveguide width; residual stress; stress balance; stress induced birefringence; top clad stress; waveguide fabrication process; Arrayed waveguide gratings; Birefringence; Circuits; Finite element methods; Optical arrays; Optical waveguides; Planar waveguides; Programmable control; Thermal expansion; Thermal stresses;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Optical Fiber Communication Conference and Exhibit, 2002. OFC 2002
Print_ISBN :
1-55752-701-6
Type :
conf
DOI :
10.1109/OFC.2002.1036212
Filename :
1036212
Link To Document :
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