Title :
A new development in embedded computer performance measurement
Author :
Kohalmi, Diane ; Newport, John ; Paul, Diane ; Roark, Chuck ; Struble, David G.
Author_Institution :
US Naval Avionics Center, Indianapolis, IN, USA
Abstract :
The authors report on the results of Phase I of the Advanced Avionics Technology Demonstration (AATD) Embedded Computer Performance Measurement (ECPM) program performanced by Texas Instruments (TI) for the Naval Avionics Center (NAC). During Phase I of the AATD program, novel techniques were developed to measure spare processing throughput and I/O for use in comparing different embedded computer systems and to measure spare processing throughput and spare I/O percentages in support of US government standards such as TADSTAND D, which defines Navy policy requirements for computer reserves. TI used its MIL-STD-1750A based Mission Display Processor (MDP), developed for the YF-22 ATF DEM/VAL program, as the initial target computing system for this effort. The cornerstone of the benchmark is a NAC Developed navigation program which was hosted on a VAX and retargeted by TI to its MDP
Keywords :
aerospace computing; aerospace simulation; computer testing; military computing; performance evaluation; standards; Ada; Advanced Avionics Technology Demonstration; I/O; MIL-STD-1750A; Mission Display Processor; Naval Avionics Center; Navy; TADSTAND D; TI; Texas Instruments; US government standards; VAX; YF-22 ATF DEM/VAL program; benchmark; embedded computer performance measurement; navigation; spare processing throughput; Aerospace electronics; Computer displays; Computer performance; Embedded computing; Instruments; Military computing; Performance evaluation; Phase measurement; Throughput; US Government;
Conference_Titel :
Aerospace and Electronics Conference, 1991. NAECON 1991., Proceedings of the IEEE 1991 National
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-0085-8
DOI :
10.1109/NAECON.1991.165817
