Title :
Developing intelligent automatic test equipment
Author :
Simpson, William R. ; Sheppard, John W.
Author_Institution :
ARINC Res. Corp., Annapolis, MD, USA
Abstract :
The authors discuss internal research of the past 10 years which led to the evolution of several maintenance tools and an architecture for intelligent ATE (automatic test equipment). Specifically, the objectives of the research program, some of its results, and its applications are reviewed. A demonstration intelligent ATE system consisting of a Racal-Dana VXI, instruments-on-a-board automatic test unit for an AV8B power supply is described, and the capabilities of this system and its implications for more generic ATE architectures are discussed
Keywords :
automatic test equipment; computer architecture; electronic equipment testing; fault location; knowledge based systems; maintenance engineering; military equipment; power supplies to apparatus; ARINC; AV8B power supply; Air Force; Army; Navy; POINTER; Racal-Dana VXI; STAMP; aircraft; airline industry; automotive industry; fault diagnosis; inference system; intelligent ATE; intelligent automatic test equipment; maintenance tools; Automatic control; Automatic test equipment; Automatic testing; Automation; Built-in self-test; Computer interfaces; Fault trees; Instruments; System testing; Test equipment;
Conference_Titel :
Aerospace and Electronics Conference, 1991. NAECON 1991., Proceedings of the IEEE 1991 National
Conference_Location :
Dayton, OH
Print_ISBN :
0-7803-0085-8
DOI :
10.1109/NAECON.1991.165914
