• DocumentCode
    2302157
  • Title

    Quality Driven Manufacturing and SOC Designs

  • Author

    Venkataraman, Srikanth ; Nagapalli, Nagesh ; Jozwiak, Lech

  • Author_Institution
    Intel
  • fYear
    2007
  • fDate
    39142
  • Firstpage
    5
  • Lastpage
    5
  • Keywords
    Automatic test pattern generation; Automatic testing; Design for manufacture; Design for testability; Failure analysis; Manufacturing processes; Pattern analysis; Semiconductor device manufacture; Silicon; Test pattern generators;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
  • Conference_Location
    San Jose, CA, USA
  • Print_ISBN
    0-7695-2795-7
  • Type

    conf

  • DOI
    10.1109/ISQED.2007.131
  • Filename
    4148999
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2302157