Title :
Modeling methods of the test inputs for analysis the digital devices
Author :
Melnik, Vladimir I. ; Mikhailov, Alexander N. ; Grishkin, Valery M. ; Ovsyannikov, Dmitri A. ; Yelaev, Yevgeny V.
Author_Institution :
Open Joint Stock Co., St. Petersburg, Russia
fDate :
June 30 2014-July 4 2014
Abstract :
The test check of complex digital devices is a difficult problem. The computer-aided design system (CAD) “SimTest” was developed so as to automate the process of digital device test-program making.
Keywords :
circuit CAD; test equipment; CAD SimTest; complex digital device test check; computer-aided design system; digital device analysis; digital device test-program process; test input modeling methods; Companies; Debugging; Design automation; Electronic mail; Solid modeling; Standards; Testing;
Conference_Titel :
Emission Electronics (ICEE), 2014 2nd International Conference on
Conference_Location :
St. Petersburg
DOI :
10.1109/Emission.2014.6893969
