Title :
Magic Simulation of Atmospheric Pressure Plasma Torch Interactions with Surface
Author :
Chung, Max ; Lin, Hung-Yi ; Tsai, Jen-Hui ; Chu, Chin-Chen
Author_Institution :
Dept. of Electron. Eng., Southern Taiwan Univ., Tainan
Abstract :
Atmospheric pressure plasma (APP) is gaining many grounds in surface modification, photo resist cleaning, medical instrument decontamination, and air pollution control. Previous simulation results were performed mostly with fluid simulations, in which potential profile, electron temperature, and plasma chemistry are available, but lack the details in field emission, secondary electrons, and space charge effect which is important in high pressure plasma. On the other hand, Particle-In-Cell simulation is time consuming. We try to perform a simulation on APP source with MAGIC code, and direct the plasma towards a surface that is to be modified and observe the effect of applied voltage, flow speed, field emission, secondary electrons, Electron Energy Distribution Function (EEDF) and ion temperature. We separate these effects into different simulations, and plasma chemistry is ignored. Simulation results indicate just these particle simulation can reveal many useful insight into operations of an APP source on surface.
Keywords :
atmospheric pressure; plasma simulation; plasma torches; MAGIC code; air pollution control; atmospheric pressure plasma torch interactions; electron energy distribution function; field emission; high pressure plasma; magic simulation; medical instrument decontamination; particle-in-cell simulation; photo resist cleaning; plasma chemistry; secondary electrons; space charge effect; surface modification; Atmospheric modeling; Atmospheric-pressure plasmas; Electron emission; Medical simulation; Plasma chemistry; Plasma simulation; Plasma sources; Plasma temperature; Resists; Surface contamination; atmospheric pressure plasma; fluid; particle-in-cell; plasma simulation; surface modification;
Conference_Titel :
IEEE International Power Modulators and High Voltage Conference, Proceedings of the 2008
Conference_Location :
Las Vegas, NE
Print_ISBN :
978-1-4244-1534-2
Electronic_ISBN :
978-1-4244-1535-9
DOI :
10.1109/IPMC.2008.4743655