• DocumentCode
    2303065
  • Title

    Challenges in Evaluations for a Typical-Case Design Methodology

  • Author

    Kunitake, Yuji ; Chiyonobu, Akihiro ; Tanaka, Koichiro ; Sato, Toshinori

  • Author_Institution
    Kyushu Inst. of Technol., Kitakyushu
  • fYear
    2007
  • fDate
    26-28 March 2007
  • Firstpage
    374
  • Lastpage
    379
  • Abstract
    According to the current trend of increasing variations in process technologies and thus in performance, the conservative worst-case design will not work since design margins can not be provided. The authors are investigating a typical-case design methodology, where designers focus on typical cases rather than on rarely-occurring worst cases. On evaluating the typical-case design, accurate circuit delay has to be considered, which is ignored in the current architectural-level simulations. While gate-level simulations consider circuit delay, they require huge amount of simulation time and hence are inappropriate for system designs, where designers examine a wide variety of design choices. In this paper, the authors show the challenges in evaluating designs that are based on the typical-case design methodology, and build a prototype architectural-level simulator, which can estimate circuit delay within tolerable simulation time
  • Keywords
    delays; integrated circuit design; circuit delay; integrated circuit design; semiconductor manufacturing process; Adders; Circuit simulation; Delay effects; Delay estimation; Design methodology; Logic circuits; Microprocessors; Timing; Virtual prototyping; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7695-2795-7
  • Type

    conf

  • DOI
    10.1109/ISQED.2007.46
  • Filename
    4149064