• DocumentCode
    2303263
  • Title

    System Level Estimation of Interconnect Length in the Presence of IP Blocks

  • Author

    Taghavi, Taraneh ; Nahapetian, Ani ; Sarrafzadeh, Majid

  • Author_Institution
    Dept. of Comput. Sci., UCLA, Los Angeles, CA
  • fYear
    2007
  • fDate
    26-28 March 2007
  • Firstpage
    438
  • Lastpage
    443
  • Abstract
    With the increasing size and sophistication of circuits and specifically in the presence of IP blocks, new wirelength estimation methods are needed in the design flow of large-scale circuits. Up to now, the proposed techniques for wirelength estimation in the presence of IP blocks approached this problem either in a flat framework based on the geometrical structure of the circuit or in a hierarchical framework based on uniform distribution property for standard cells. In this paper, the authors propose a technique for hierarchical derivation of wirelength estimation in the presence of single and multiple blockages using Rent´s parameter of the circuit by assuming non-uniform probability distribution for standard cells. To measure the accuracy of the estimation, the authors compared the results with the results of placement and routing using a commercial CAD tool. The results illustrate that in the presence of multiple IP blocks, the average error of our technique is less than 8%, as compared to its counterparts with the average error of 35% and 150%
  • Keywords
    circuit layout CAD; integrated circuit interconnections; integrated circuit layout; CAD tool; IP blocks; Rent rule; hierarchical placement; nonuniform probability distribution; wirelength estimation; Analytical models; Computer errors; Computer science; Design automation; Frequency estimation; Integrated circuit interconnections; Large-scale systems; Parameter estimation; Probability distribution; Routing; Hierarchical Placement; IP Blocks; Large-scale Circuits; Non-Uniform Probability Distribution; Rent´s Rule; Wirelength Estimation;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7695-2795-7
  • Type

    conf

  • DOI
    10.1109/ISQED.2007.154
  • Filename
    4149075