DocumentCode
2303263
Title
System Level Estimation of Interconnect Length in the Presence of IP Blocks
Author
Taghavi, Taraneh ; Nahapetian, Ani ; Sarrafzadeh, Majid
Author_Institution
Dept. of Comput. Sci., UCLA, Los Angeles, CA
fYear
2007
fDate
26-28 March 2007
Firstpage
438
Lastpage
443
Abstract
With the increasing size and sophistication of circuits and specifically in the presence of IP blocks, new wirelength estimation methods are needed in the design flow of large-scale circuits. Up to now, the proposed techniques for wirelength estimation in the presence of IP blocks approached this problem either in a flat framework based on the geometrical structure of the circuit or in a hierarchical framework based on uniform distribution property for standard cells. In this paper, the authors propose a technique for hierarchical derivation of wirelength estimation in the presence of single and multiple blockages using Rent´s parameter of the circuit by assuming non-uniform probability distribution for standard cells. To measure the accuracy of the estimation, the authors compared the results with the results of placement and routing using a commercial CAD tool. The results illustrate that in the presence of multiple IP blocks, the average error of our technique is less than 8%, as compared to its counterparts with the average error of 35% and 150%
Keywords
circuit layout CAD; integrated circuit interconnections; integrated circuit layout; CAD tool; IP blocks; Rent rule; hierarchical placement; nonuniform probability distribution; wirelength estimation; Analytical models; Computer errors; Computer science; Design automation; Frequency estimation; Integrated circuit interconnections; Large-scale systems; Parameter estimation; Probability distribution; Routing; Hierarchical Placement; IP Blocks; Large-scale Circuits; Non-Uniform Probability Distribution; Rent´s Rule; Wirelength Estimation;
fLanguage
English
Publisher
ieee
Conference_Titel
Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
Conference_Location
San Jose, CA
Print_ISBN
0-7695-2795-7
Type
conf
DOI
10.1109/ISQED.2007.154
Filename
4149075
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