Title :
Assertion Checkers in Verification, Silicon Debug and In-Field Diagnosis
Author :
Boulé, Marc ; Chenard, Jean-Samuel ; Zilic, Zeljko
Author_Institution :
McGill Univ., Montreal, Que.
Abstract :
Assertion based design, and more specifically, assertion based verification (ABV) is quickly gaining wide acceptance in the design community. Assertions are mainly targeted at functional verification during the design and verification phases. In this paper, we concentrate on the use of assertions in post-fabrication silicon debug. We develop tools that efficiently generate the checkers from assertions, for their inclusion in the debug phase. We also detail how a checker generator can be used as a means of circuit design for certain portions of self test circuits, and more generally the design of monitoring circuits. Efficient subset partitioning of checkers for a dedicated fixed-size reprogrammable logic area is developed for efficient use of dedicated debug hardware
Keywords :
automatic testing; formal verification; integrated circuit design; temporal logic; assertion based design; assertion based verification; assertion checkers; checker generator; circuit design; functional verification; in-field diagnosis; post-fabrication silicon debug; self test circuits; Automatic testing; Built-in self-test; Circuit simulation; Circuit synthesis; Circuit testing; Debugging; Hardware; Logic design; Monitoring; Silicon;
Conference_Titel :
Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
Conference_Location :
San Jose, CA
Print_ISBN :
0-7695-2795-7
DOI :
10.1109/ISQED.2007.38