DocumentCode :
2304250
Title :
Measuring the linewidth enhancement factor of optoelectronics devices based on a Mach-Zehnder interferometer
Author :
Provost, Jean-Guy ; Grillot, Frédéric
Author_Institution :
III-V Lab., Alcatel-Thales, Marcoussis, France
fYear :
2010
fDate :
7-11 Nov. 2010
Firstpage :
425
Lastpage :
426
Abstract :
A technique based on a Mach-Zehnder interferometer is proposed in order to evaluate dynamical properties of optoelectronic devices. In particular this experimental setup allows extracting the value and the sign of the linewidth enhancement factor.
Keywords :
Mach-Zehnder interferometers; distributed feedback lasers; optoelectronic devices; quantum well lasers; Mach-Zehnder interferometer; linewidth enhancement factor; optoelectronics devices;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
IEEE Photonics Society, 2010 23rd Annual Meeting of the
Conference_Location :
Denver, CO
ISSN :
-
Print_ISBN :
978-1-4244-5368-9
Electronic_ISBN :
-
Type :
conf
DOI :
10.1109/PHOTONICS.2010.5698941
Filename :
5698941
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2304250
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