• DocumentCode
    2304397
  • Title

    Provisioning On-Chip Networks under Buffered RC Interconnect Delay Variations

  • Author

    Mondal, Mosin ; Ragheb, Tamer ; Wu, Xiang ; Aziz, Adnan ; Massoud, Yehia

  • Author_Institution
    Rice Univ., Houston, TX
  • fYear
    2007
  • fDate
    26-28 March 2007
  • Firstpage
    873
  • Lastpage
    878
  • Abstract
    A network-on-chip (NoC) replaces on-chip communication implemented by point-to-point interconnects in a multi-core environment by a set of shared interconnects connected through programmable crosspoints. Since an NoC may provide a number of paths between a given source and destination, manufacturing or runtime faults on one interconnect does not necessarily render the chip useless. It is partly because of this fault tolerance that NoCs have emerged as a viable alternative for implementing communication between functional units of a chip in the nanometer regime, where high defect rates are prevalent. In this paper, the authors quantify the fault tolerance offered by an NoC against process variations. Specifically, the authors develop an analytical model for the probability of failure in buffered global NoC links due to interconnect dishing, and effective channel length variation. Using the developed probability model, the authors study the impact of link failure on the number of cycles required to establish communications in NoC applications
  • Keywords
    delay circuits; fault tolerance; integrated circuit interconnections; network-on-chip; buffered RC interconnect delay variations; fault tolerance; multicore environment; network-on-chip; on-chip networks; point-to-point interconnects; probability model; Analytical models; CMOS technology; Circuit faults; Delay; Fault tolerance; Hardware; Integrated circuit interconnections; Network-on-a-chip; Planarization; Surface resistance;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Quality Electronic Design, 2007. ISQED '07. 8th International Symposium on
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7695-2795-7
  • Type

    conf

  • DOI
    10.1109/ISQED.2007.129
  • Filename
    4149143