• DocumentCode
    230510
  • Title

    Advanced 1.1um pixel CMOS image sensor with 3D stacked architecture

  • Author

    Liu, J.C. ; Yaung, D.N. ; Sze, J.J. ; Wang, Cheng C. ; Hung, Gene ; Wang, C.J. ; Hsu, T.H. ; Lin, R.J. ; Wang, T.J. ; Wang, W.D. ; Cheng, H.Y. ; Lin, J.S. ; Tsai, S.J. ; Tsai, S.T. ; Chuang, C.C. ; Hsu, W.I. ; Chen, Song Yan ; Huang, Kai C. ; Wu, W.H. ; T

  • Author_Institution
    Taiwan Semicond. Manuf. Co., Hsinchu, Taiwan
  • fYear
    2014
  • fDate
    9-12 June 2014
  • Firstpage
    1
  • Lastpage
    2
  • Abstract
    This paper demonstrates an advanced 1.1um pixel backside illuminated CMOS image sensor with a 3D stacked architecture. The carrier wafer in conventional BSI is replaced by ASIC wafer, which contains a part of periphery circuit and is connected to the sensor wafer through bonding technology. With proper layout design and process improvement, the impact of 3D connection (Through Via, TV) on the sensor performance can be significantly minimized. In addition, for the first time, the degradation of stacked pixel performance during the folded circuit operation under sensor array is found and improved. The final stacked sensor exhibits the comparable pixel performances to conventional BSI. Furthermore, stacked architecture provides the opportunity to enhance sensor performance by the separate process tuning for sensor wafers (without any effect on ASIC wafers), leading to a further improvement of dark performance.
  • Keywords
    CMOS image sensors; application specific integrated circuits; integrated circuit design; 3D connection; 3D stacked architecture; ASIC wafer; backside illuminated CMOS image sensor; bonding technology; carrier wafer; sensor array; sensor wafers; Application specific integrated circuits; Arrays; Bonding; CMOS image sensors; Stress; TV; Three-dimensional displays; CMOS image sensor; pixel; stacked;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Technology (VLSI-Technology): Digest of Technical Papers, 2014 Symposium on
  • Conference_Location
    Honolulu, HI
  • ISSN
    0743-1562
  • Print_ISBN
    978-1-4799-3331-0
  • Type

    conf

  • DOI
    10.1109/VLSIT.2014.6894429
  • Filename
    6894429