DocumentCode :
2305134
Title :
Compliance metric for the S-bend lead design for surface mount components, with application to clip-leads
Author :
Kotlowitz, Robert W. ; Nevarez, Ivan M.
Author_Institution :
AT&T Bell Labs., Whippany, NJ, USA
fYear :
1993
fDate :
1-4 Jun 1993
Firstpage :
1104
Lastpage :
1114
Abstract :
New stiffness metrics have been developed from an upgraded S-lead structural model that extends compliance evaluation capabilities to a wide variety of commercial S-lead designs. By selectively eliminating lead members, the generalized S-lead structural model can be used to represent a broad range of common lead forms for SM (surface mount) components. The S-lead directional spring constants are given in an easy-to-apply, algebraic format suitable for computer and spread-sheet evaluation. Compliance evaluation has been performed for a commercial S-bend clip-lead specifically developed for high-reliability SM interconnection of CCCs (ceramic chip carriers) on organic circuit-boards. Accelerated powered cycling of clip-leaded CCCs on epoxy-glass circuit-boards has shown that leads with diagonal stiffness in the nominal range of 10-40 lb/in provide a comparatively high margin for SM attachment reliability. The diagonal stiffness of S-bend lead designs can be tailored by using the upgraded compliance formulation to optimize the contour and critical dimensions
Keywords :
circuit reliability; elastic constants; life testing; printed circuit design; printed circuit manufacture; printed circuit testing; surface mount technology; S-bend lead design; S-lead structural model; accelerated powered cycling; attachment reliability; ceramic chip carriers; clip-leads; compliance metric; diagonal stiffness; directional spring constants; epoxy-glass circuit-boards; high-reliability SM interconnection; stiffness metrics; surface mount components; Ceramics; Design optimization; Independent component analysis; Integrated circuit interconnections; Lead; Mechanical engineering; Packaging; Samarium; Springs; Thermal expansion;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1993. Proceedings., 43rd
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-0794-1
Type :
conf
DOI :
10.1109/ECTC.1993.346696
Filename :
346696
Link To Document :
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