DocumentCode :
2305941
Title :
A silicon-on-silicon packaging technology for advanced ULSI chips
Author :
Kousaka, T. ; Senba, Naoji ; Nishizawa, Atsushi ; Takahashi, Nobuaki ; Shimoto, Tadanori ; Koike, Tsuneo
Author_Institution :
NEC Corp., Sagamihara, Japan
fYear :
1993
fDate :
1-4 Jun 1993
Firstpage :
941
Lastpage :
947
Abstract :
A RISC (reduced instruction set computer) module for high-performance workstations has been made to demonstrate the advantages and technical feasibility of the silicon-on-silicon technology. The module consists of one 0.8-μm CMOS CPU (central processing unit) one 0.8-μm CMOS FPU, and six 1.0-μm BiCMOS cache memories. The eight chips are attached on a 39×47 mm square silicon substrate with 120-μm pitch flip chip bonding of 80-μm-diameter tin-lead bumps. Two-layer interconnections for high-speed signals are formed with 20-μm line and 80-μm space on the silicon substrate. The conductors are 4-μm thick gold formed by electroplating and the dielectric film is 10-μm-thick polyimide. A decoupling capacitance of about 0.8 nF is formed in the substrate. The module was evaluated using reliability and functional tests. The reliability tests included thermal cycling, power cycling, and mechanical strength tests. The functional test was carried out by connecting the module to an IBM-PC/IF board and operating with a test program. Both evaluations were successful
Keywords :
VLSI; circuit reliability; elemental semiconductors; flip-chip devices; integrated circuit technology; microassembling; microprocessor chips; multichip modules; reduced instruction set computing; silicon; 0.8 nF; 0.8 to 120 micron; Au; BiCMOS cache memories; CMOS CPU; CMOS FPU; MCM; RISC module; Si-on-Si packaging technology; ULSI chips; central processing unit; decoupling capacitance; dielectric film; electroplating; flip chip bonding; functional tests; high-performance workstations; polyimide; reduced instruction set computer module; reliability tests; thick Au conductors; two-layer interconnections; CMOS process; CMOS technology; Central Processing Unit; Computer aided instruction; Dielectric substrates; Packaging; Reduced instruction set computing; Silicon; Testing; Ultra large scale integration;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Components and Technology Conference, 1993. Proceedings., 43rd
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-0794-1
Type :
conf
DOI :
10.1109/ECTC.1993.346740
Filename :
346740
Link To Document :
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