Title :
Study of soldering for VLSI/FLC spatial light modulators
Author :
Lin, Wei ; Lee, Y.C. ; Johnson, K.M.
Author_Institution :
Dept. of Mech. Eng., Colorado Univ., Boulder, CO, USA
Abstract :
Spatial light modulators (SLM) using ferroelectric liquid crystal over a very large scale integrated circuit (VLSI/FLC) are critical elements to high-definition displays, pattern correlation, and many other optoelectronic processing systems. A self-aligning soldering technology is being developed to package these high-performance modulators cost-effectively. It needs to achieve a uniform, μm-level gap for FLC, and align the glass, the VLSI, and the substrate with an accuracy of 10 μm. Two studies have been conducted to assist the technology development. The first designs the solder joints for the assembly. By modeling, 0.4 mm3 is chosen for the volume of the large solder joints (1000 μm in diameter) that would produce the maximum force pulling the glass against the VLSI for the gap control. Also, 11.4×106 μm3 is chosen for the volume of the medium solder joints (500 μm in diameter) under the VLSI for low-cost self-alignments. The second study develops a fluxless soldering process with the measurements of the surface tension coefficients w.r.t. different reflow parameters. The optimum parameters are 280°C of the hot paddle and 2.5 liter/min flow rate of the forming gas. The achieved surface tension coefficient is abound 280 dyne/cm that assures the quality of the developed soldering is as good as that of the soldering using flux. A glass/silicon test vehicle is soldered with the optimum parameters. The range of its gap thicknesses measured over the entire area is from 1.7 to 2.6 μm. The developed soldering technology achieves the required μm-level gap with sub-μm uniformity
Keywords :
VLSI; ferroelectric devices; ferroelectric liquid crystals; integrated circuit technology; liquid crystal devices; optical workshop techniques; packaging; soldering; spatial light modulators; surface tension; 280 C; Si; VLSI/FLC spatial light modulators; fluxless soldering; glass/silicon test vehicle; micron-level gap; optoelectronic processing; package; reflow parameters; self-alignment; solder joints; soldering technology; surface tension coefficients; Assembly; Ferroelectric materials; Glass; Integrated circuit packaging; Integrated circuit technology; Liquid crystal displays; Optical modulation; Soldering; Surface tension; Very large scale integration;
Conference_Titel :
Electronic Components and Technology Conference, 1993. Proceedings., 43rd
Conference_Location :
Orlando, FL
Print_ISBN :
0-7803-0794-1
DOI :
10.1109/ECTC.1993.346800