• DocumentCode
    230736
  • Title

    Improving the topografiner technology down to nanometer spatial resolution

  • Author

    Zanin, D.A. ; De Pietro, L.G. ; Cabrera, H. ; Kostanyan, A. ; Vindigni, A. ; Pescia, D. ; Ramsperger, U.

  • Author_Institution
    Lab. for Solid State Phys., ETH Zurich, Zurich, Switzerland
  • fYear
    2014
  • fDate
    6-10 July 2014
  • Firstpage
    141
  • Lastpage
    142
  • Abstract
    In Scanning Tunnelling Microscopy (STM) the electrons are confined within the tunneling region, and this limitation has redirected scientists to alternative microscopy techniques, aimed at extracting the electrons away from the tunneling region. The topografiner - strictly speaking a precursor of STM, originally developed at the National Bureau of Standards - is an example. In this paper we report on the latest improvements of the topografiner technology that allow resolving topographic contrast with a lateral resolution down to 7 Å.
  • Keywords
    scanning tunnelling microscopy; tunnelling; STM; nanometer spatial resolution; scanning tunnelling microscopy; topografiner technology; topographic contrast; tunneling region; Electron beams; Iron; Junctions; Microscopy; Spatial resolution; Surface topography; Tunneling; Field Emission; Secondary Electron; Topografiner;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Vacuum Nanoelectronics Conference (IVNC), 2014 27th International
  • Conference_Location
    Engelberg
  • Print_ISBN
    978-1-4799-5306-6
  • Type

    conf

  • DOI
    10.1109/IVNC.2014.6894818
  • Filename
    6894818