Further investigations into edge-fed cavity backed patches

In this paper we experimentally verify the proposed technique. A prototype based on the simulations presented in [W.S.T. Rowe and R.B. Waterhouse, 2006] was fabricated and the return loss and radiation performance was measured. We also fabricated a base-line case, namely, a conventional edge-fed patch on the same thickness dielectric substrate and measured its performance. It was found that the new cavity backed edge-fed radiator improves the gain by 3 dB and reduces the pattern undulation by 10 dB. In this paper we also present some theoretical results of applying a variation of the cavity backed procedure to radiators that can be directly integrated with monolithic microwave integrated circuit (MMIC) and opto-electronic integrated circuit (OEIC) materials [W.S.T. Rowe and R.B. Waterhouse, 2003]. The new configuration potentially overcomes the trade-offs associated with trying to develop patch-based radiators on very thin, high dielectric constant material.