• DocumentCode
    2309906
  • Title

    Concurrent test supported by DFT techniques and ATE companies

  • fYear
    2010
  • fDate
    2-4 Nov. 2010
  • Firstpage
    1
  • Lastpage
    1
  • Abstract
    Concurrent Test needs support by DFT and ATE. A lot of devices are suitable for concurrent test, but what about ATE hardware and software? Do they support concurrent test adequately? What are the different philosophies in DFT and ATE hardware and software?
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Test Conference (ITC), 2010 IEEE International
  • Conference_Location
    Austin, TX, USA
  • ISSN
    1089-3539
  • Print_ISBN
    978-1-4244-7206-2
  • Type

    conf

  • DOI
    10.1109/TEST.2010.5699291
  • Filename
    5699291
    • Link To Document
    https://search.isc.ac/dl/search/defaultta.aspx?DTC=49&DC=2309906