Title :
WS2 thin films a new candidate for solar cells
Author :
Jäger-Waldau, A. ; Lux-Steiner, M.Ch. ; Bucher, E. ; Jager-Waldau, G.
Author_Institution :
Fakultat fur Phys., Konstanz Univ., Germany
Abstract :
Polycrystalline thin films of the layered semiconductor tungsten disulphide were prepared by sulphurization of RF sputtered tungsten films in a closed tube system. Two types of crystal orientation were obtained depending on the sulphur source temperature. By atomic force microscopy on films with the van der Waals planes parallel to the substrate atomic resolution of WS2 surfaces could be observed for the first time. With as-grown WS2 films and n-ZnO as window material it was possible to fabricate photosensitive heterojunctions for the first time. These devices were prepared with the ohmic Au contact close to the ZnO emitter layer on top of the WS2 films. Despite that this planar diode geometry is not optimized yet, I-V measurements revealed open-circuit voltages up to 360 mV and short-circuit currents with a maximum of ISC=0.65 mA/cm2 under simulated Sun illumination
Keywords :
II-VI semiconductors; atomic force microscopy; p-n heterojunctions; semiconductor device models; semiconductor growth; semiconductor thin films; solar cells; sputter deposition; sputtered coatings; tungsten compounds; van der Waals forces; zinc compounds; 360 mV; Au; I-V measurements; RF sputtered tungsten films; WS2-ZnO; atomic force microscopy; closed tube system; crystal orientation; emitter layer; ohmic Au contact; open-circuit voltage; photosensitive heterojunctions; planar diode geometry; polycrystalline thin films; short-circuit current; solar cells; substrate atomic resolution; van der Waals planes; window material; Atomic force microscopy; Atomic layer deposition; Heterojunctions; Radio frequency; Semiconductor films; Semiconductor thin films; Sputtering; Substrates; Temperature dependence; Tungsten;
Conference_Titel :
Photovoltaic Specialists Conference, 1993., Conference Record of the Twenty Third IEEE
Conference_Location :
Louisville, KY
Print_ISBN :
0-7803-1220-1
DOI :
10.1109/PVSC.1993.347026